Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings (Lecture Notes in Computer Science)
by David Naccache,Luca Breveglieri,Israel Koren,Jean-Pierre Seifert
ISBN 13: 9783540462507
Format: Paperback (268 pages) Publisher: Springer Published: 13 Jun 2008
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